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Date : 1996-11-28
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Monographs on the Physics and Chemistry of Materials ~ Monographs on the Physics and Chemistry of Materials Showing 120 of 25 Previous Next List Grid Monographs on the Physics and Chemistry of Materials Atom Probe Field Ion Microscopy 21500 Add Atom Probe Field Ion Microscopy to Cart M K Miller A Cerezo M G 9780198513872

Atom Probe Field Ion Microscopy IOPscience ~ This book is one of the series of Monographs on the physics and chemistry of materials published by the Clarendon Press Its title is perhaps unduly restrictive inasmuch as the identification of single atoms in the field ion microscope Atom probe FIM is merely the end stage in a long chain of computerassisted operations plus the equally important task of interpreting the projected image

Atom Probe Field Ion Microscopy M K Miller A Cerezo ~ The atom probe technique permits the imaging and chemical identification of individual and solid surfaces It is one of the most important experimental methods in the emerging field of atomicscale science and technology This book gives a definitive and uptodate account of the field and is written by leading authorities on the subject

Atom Probe Field Ion Microscopy Monographs on the Physics ~ Fishpond Thailand Atom Probe Field Ion Microscopy Monographs on the Physics and Chemistry of Materials by M K Cerezo MillerBuy Books online Atom Probe Field Ion Microscopy Monographs on the Physics and Chemistry of Materials 1996

Atom Probe Field Ion Microscopy Monographs on the Physics ~ Fishpond Indonesia Atom Probe Field Ion Microscopy Monographs on the Physics and Chemistry of Materials by M K Cerezo MillerBuy Books online Atom Probe Field Ion Microscopy Monographs on the Physics and Chemistry of Materials 1996

The Atom‐Probe Field Ion Microscope Review of Scientific ~ A serious limitation of the field ion microscope has been its inability to identify the chemical nature of the individually imaged atoms The newly conceived atom‐probe FIM is a combination probe‐hole FIM and mass spectrometer having single particle sensitivity During observation the observer selects an atomic site of interest by placing it over a probe hole in the image screen Pulsed

Tomography by Atom Probe Field Ion Microscopy SpringerLink ~ The Field Ion Microscope FIM introduced by Müller was the first instrument capable of imaging metal surfaces with atomic resolution in real space 1–7 The FIM was originally employed to solve problems related to surface physics and crystallography

Atom probe Wikipedia ~ The atom probe was introduced at the 14th Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J A Panitz It combined a field ion microscope with a mass spectrometer having a single particle detection capability and for the first time an instrument could “ determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”

Atom probe tomography ScienceDirect ~ The evolution of the technique from the initial atom probe field ion microscope to todays stateoftheart three dimensional atom probe is outlined An introduction is presented on the basic physics behind the technique the operation of the instrument and the reconstruction of the threedimensional data

Advances in PulsedLaser Atom Probe Instrument and ~ The performance of the pulsedlaser atom probe can be limited by both instrument and specimen factors The experiments described in this article were designed to identify these factors so as to provide direction for further instrument and specimen development